Notes from experimenting with our equipment to slowly build up process knowledge for the various semiconductor steps.
Check the FAFO Semiconductor Processes project page for an overview.
This page is a lab notebook. It documents the work done in the lab and our thoughts, theories, and findings related to it. Everything you read here is work in progress and not final results. We believe it is best to have our lab notes out in the open, because it gives more detailed insight into what worked for us and what didn't. Of course you can also use this page to follow our progress!
Experiments with DC sputter deposition on our Edwards AUTO 306 Coating System of Cr in 'plasma process' mode and with MFC (mass flow controller).
Flow rerouted through mass flow controller (Ar line moved from needle valve to Ar MFC). Controlled over DE9 port by providing +/-15V and a 0-10V control signal. 10V == 100SCCM.
Process parameters:
Best results so far: (good balance between plasma size and speed) 1-2 min, 100W, 2.6 * 10^-2 mbar (~10SCCM). Higher Ar pressures limited plasma size considerably.
Process used:
Tests were performed on Al foil with parameters written down. Test pieces are in the SEM sample box.
Consistency yet to be measured.